Identifying Root Cause of Bugs by Capturing Changed Code Lines With Relational Graph Neural Networks

Co-Author IF: 10.9 JCR Q1

Jiaqi Zhang, Shikai Guo, Hui Li, Chenchen Li, Yu Chai, Rong Chen

Published in:

IEEE Transactions on Consumer Electronics

Date of Publication:

07 October 2025

DOI:

10.1109/TCE.2025.3614479

Paper

@article{Zhang2025Identifying},
  title={Identifying Root Cause of Bugs by Capturing Changed Code Lines With Relational Graph Neural Networks},
  author={Zhang, Jiaqi and Guo, Shikai and Li, Hui and Li, Chenchen and Chai, Yu and Chen, Rong},
  journal={IEEE Transactions on Consumer Electronics},
  year={2025},
  doi={10.1109/TCE.2025.3614479}
}

Zhang, J., Guo, S., Li, H., Li, C., Chai, Y., Chen, R. (2025). Identifying Root Cause of Bugs by Capturing Changed Code Lines With Relational Graph Neural Networks. IEEE Transactions on Consumer Electronics. https://doi.org/10.1109/TCE.2025.3614479

ZHANG J, GUO S, LI H, et al. Identifying Root Cause of Bugs by Capturing Changed Code Lines With Relational Graph Neural Networks[J]. IEEE Transactions on Consumer Electronics, 2025. DOI:10.1109/TCE.2025.3614479

Jiaqi Zhang, Shikai Guo, Hui Li, Chenchen Li, Yu Chai, and Rong Chen. "Identifying Root Cause of Bugs by Capturing Changed Code Lines With Relational Graph Neural Networks." IEEE Transactions on Consumer Electronics, 2025. https://doi.org/10.1109/TCE.2025.3614479

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